Fiche personnelle: Davide De Salvador
Davide De Salvador
Cours
- Enseignant: Davide De Salvador
- Enseignant: Lucia Gabelli
- Enseignant: Marco Mazzocco
- Enseignant: Cinzia Sada
- Enseignant: Vincenzo Amendola
- Enseignant: Tiziana Cesca
- Enseignant: Davide De Salvador
- Enseignant: Alberta Ferrarini
- Enseignant: Giovanni Mattei
- Enseignant: Luca Salasnich
- Enseignant: Francesco Sedona
The basic principles of HR-XRD and XRR for structural characterization of crystalline
and amorphous thin films will be discussed.
Cystalline layers; Mismatch and strain; Reciprocal space mapping; X-ray kinematical
diffraction theory, X-ray dinamical diffraction theory; X-ray reflectivity;
Some data taking and analysis example will be given.
- Enseignant: Marco Bazzan
- Enseignant: Davide De Salvador
- Enseignant: Giovanna Brusatin
- Enseignant: Davide De Salvador
- Enseignant: Andrea Sartorel
- Enseignant: Vincenzo Amendola
- Enseignant: Davide De Salvador
- Enseignant: Alberta Ferrarini
- Enseignant: Matteo Ambrogio Paolo Pierno
- Enseignant: Gian-Andrea Rizzi
- Enseignant: Francesco Sedona
- Enseignant: Raffaella Signorini
- Enseignant: Luca Valentini