The basic principles of HR-XRD and XRR for structural characterization of crystalline
and amorphous thin films will be discussed.
Cystalline layers; Mismatch and strain; Reciprocal space mapping; X-ray kinematical
diffraction theory, X-ray dinamical diffraction theory; X-ray reflectivity;
Some data taking and analysis example will be given.
- Teacher: Marco Bazzan
- Teacher: Davide De Salvador