Personal profile: Davide De Salvador
Davide De Salvador
Courses
- Teacher: Vincenzo Amendola
- Teacher: Tiziana Cesca
- Teacher: Davide De Salvador
- Teacher: Alberta Ferrarini
- Teacher: Giovanni Mattei
- Teacher: Luca Salasnich
- Teacher: Francesco Sedona
The basic principles of HR-XRD and XRR for structural characterization of crystalline
and amorphous thin films will be discussed.
Cystalline layers; Mismatch and strain; Reciprocal space mapping; X-ray kinematical
diffraction theory, X-ray dinamical diffraction theory; X-ray reflectivity;
Some data taking and analysis example will be given.
- Teacher: Marco Bazzan
- Teacher: Davide De Salvador
- Teacher: Vincenzo Amendola
- Teacher: Davide De Salvador
- Teacher: Alberta Ferrarini
- Teacher: Matteo Ambrogio Paolo Pierno
- Teacher: Gian-Andrea Rizzi
- Teacher: Francesco Sedona
- Teacher: Raffaella Signorini
- Teacher: Luca Valentini