Profilo personale: Enrico Di Russo

Categoria DIPARTIMENTO DI INGEGNERIA INDUSTRIALE - DII / Corsi anni accademici passati / A.A. 2024 - 2025 / Corsi di laurea / IN1840 - INGEGNERIA CHIMICA E DEI MATERIALI

Program: 

i) Principle, construction and operation: detection system, piezoelectric scanner, feedback loop.

ii) Basic operating modes and techniques of surface imaging: contact (static) mode, semi-contact (tapping) mode.

iii) Image analysis: common causes of artifacts: non-linearity of piezoelectric scanners, mapping of the tip, incorrect feedback loop settings, incorrect image processing, external interference (mechanical, acoustic, electrical), thermal drift, examples of images for various types of materials: crystals, polymers, biological samples.

iv) Advanced electrical modes: current AFM, piezo-force microscopy; kelvin prove force microscopy, scanning microwave microscopy.

Scheduling:

15 - 16 February 2024: theoretical lessons (3h - 3h): Aula L2  - DISC, from 14:00 to 17:00.

From 19  to 23 February 2024: lab demonstrations (2h for each small group. The demostration slots will be defined based on student commitments).

Final test, on-line.

Registration is mandatory to attend the course and receive update (to be done before 5th feb. 2024). 

Categoria DIPARTIMENTO DI SCIENZE CHIMICHE - DISC / Corsi di Dottorato / Materials Science and Technology (MST) / Didattica / Courses / A. A. 2023-2024

i) Principle, construction and operation: detection system, piezoelectric scanner, feedback loop.
ii) Basic operating modes and techniques of surface imaging: contact (static) mode, semi-contact
(tapping) mode.
iii) Image analysis: common causes of artifacts: non-linearity of piezoelectric scanners, mapping of
the
tip, incorrect feedback loop settings, incorrect image processing, external interference (mechanical,
acoustic, electrical), thermal drift iv)examples of images for various types of materials: crystals,
polymers, biological samples.
v) Advanced electrical modes: current AFM (c-AFM), piezo-force microscopy; kelvin prove force
microscopy (KPFM), scanning microwave microscopy (SMM).

8 hours

Categoria DIPARTIMENTO DI SCIENZE CHIMICHE - DISC / Corsi di Dottorato / Materials Science and Technology (MST) / Didattica / Courses / A.A. 2025-2026

The topic covered by the course are the following:
- Fundamentals of ion-matter interaction.
•MeV ion energy range:
- Coulomb interaction between one ion and one nucleus, Rutherford Backscattering
Spectrometry
- Non-Coulomb interaction techniques and Channeling phenomena
- Experimental setup for MeV ion beam analysis and examples of applications in
material science
•KeV ion energy range:
-Secondary Ion Mass Spectrometry and examples of applications in material science
-Atom Probe Tomography and Focused Ion Beam sample preparation

8 hours

Categoria DIPARTIMENTO DI SCIENZE CHIMICHE - DISC / Corsi di Dottorato / Materials Science and Technology (MST) / Didattica / Courses / A.A. 2025-2026