Atomic Force Microscopy (2025/26)

i) Principle, construction and operation: detection system, piezoelectric scanner, feedback loop.
ii) Basic operating modes and techniques of surface imaging: contact (static) mode, semi-contact
(tapping) mode.
iii) Image analysis: common causes of artifacts: non-linearity of piezoelectric scanners, mapping of
the
tip, incorrect feedback loop settings, incorrect image processing, external interference (mechanical,
acoustic, electrical), thermal drift iv)examples of images for various types of materials: crystals,
polymers, biological samples.
v) Advanced electrical modes: current AFM (c-AFM), piezo-force microscopy; kelvin prove force
microscopy (KPFM), scanning microwave microscopy (SMM).

8 hours