Program:
i) Principle, construction and operation: detection system, piezoelectric scanner, feedback loop.
ii) Basic operating modes and techniques of surface imaging: contact (static) mode, semi-contact (tapping) mode.
iii) Image analysis: common causes of artifacts: non-linearity of piezoelectric scanners, mapping of the tip, incorrect feedback loop settings, incorrect image processing, external interference (mechanical, acoustic, electrical), thermal drift, examples of images for various types of materials: crystals, polymers, biological samples.
iv) Advanced electrical modes: current AFM, piezo-force microscopy; kelvin prove force microscopy, scanning microwave microscopy.
Scheduling:
15 - 16 February 2024: theoretical lessons (3h - 3h): Aula L2 - DISC, from 14:00 to 17:00.
From 19 to 23 February 2024: lab demonstrations (2h for each small group. The demostration slots will be defined based on student commitments).
Final test, on-line.
Registration is mandatory to attend the course and receive update (to be done before 5th feb. 2024).
- Docente: Enrico Di Russo
- Docente: Francesco Sgarbossa