Opzioni di iscrizione

Program:

  • electron spectroscopies: XPS and Auger electron spectroscopy
  • the photoemission process: matrix element, cross sections, the sudden approximation model
  • the binding energy: elemental and chemical shift, auger parameter
  • shape of photoemission peaks: electronic effects (spin orbit), final state effects, anelastic losses
  • quantitative analysis by xps: sensitivity factors
  • instrumentation of xps: UHV environment, electron analyzer, x-ray source
  • examples of analysis of photoemission spectra (calculation of inelastic mean free path, peak fitting, background substraction)

Credits: 1 CFU (8 hrs)

Iscrizione spontanea (Studente)
Iscrizione spontanea (Studente)