Program:
- electron spectroscopies: XPS and Auger electron spectroscopy
- the photoemission process: matrix element, cross sections, the sudden approximation model
- the binding energy: elemental and chemical shift, auger parameter
- shape of photoemission peaks: electronic effects (spin orbit), final state effects, anelastic losses
- quantitative analysis by xps: sensitivity factors
- instrumentation of xps: UHV environment, electron analyzer, x-ray source
- examples of analysis of photoemission spectra (calculation of inelastic mean free path, peak fitting, background substraction)
- Docente: Stefano Agnoli
- Docente: Mattia Cattelan
- Docente: Gian-Andrea Rizzi