Program:
electron spectroscopies: XPS and Auger electron spectroscopy
the photoemission process: matrix element, cross sections, the sudden approximation model
the binding energy: elemental and chemical shift, auger parameter
shape of photoemission peaks: electronic effects (spin orbit), final state effects, anelastic losses
quantitative analysis by xps: sensitivity factors
instrumentation of xps: UHV environment, electron analyzer, x-ray source
examples of analysis of photoemission spectra (calculation of inelastic mean free path, peak fitting, background substraction)
- Enseignant: Mattia Cattelan